Dr Jochen Bruckbauer
Research Fellow
Physics
Personal statement
I am a postdoctoral researcher in the , part of the Department of Physics. I received my PhD from the 糖心视频 in 2013, where I investigated the luminescence properties of III-nitride semiconductor nanostructures and light-emitting diodes (LEDs). I also hold a Diplom (equivalent to an MSc) in Physics from the Technical University of Munich.
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My current research focuses on the structural characterisation of semiconductor materials鈥攑articularly III-nitrides鈥攗sing electron diffraction techniques in the scanning electron microscope. This work aims to advance our understanding of nanoscale material properties and supports the development of next-generation optoelectronic devices.
Prize And Awards
- Recipient
- 10/7/2019
- Recipient
- 26/6/2014
- Recipient
- 7/6/2011
Publications
- Hiller Kieran P, Cios Grzegorz, , Wheeler John, Parbrook Peter J, , ,
- Acta Materialia (2026)
- , , , , Gunasekar Naresh-Kumar, , ,
- Materials Vol 18 (2025)
- , Cios Grzegorz, Sarua Andrei, Feng Peng, Wang Tao, , , ,
- Journal of Applied Physics Vol 137 (2025)
- , , , , ,
- Journal of Materials Chemistry A Vol 13, pp. 11003-11014 (2025)
- Waters Dale M, Thompson Bethany, Ferenczi Gergely, , Cios Grzegorz, , Stark Christoph J M, Wetzel Christian, ,
- Journal of Applied Physics Vol 137 (2025)
- , , , , ,
- Journal of Materials Chemistry A Vol 12, pp. 25131-25139 (2024)
Research Interests
My research focuses on the structural characterisation and electron microscopy of semiconductor materials, with a particular emphasis on the III-nitride material system. III-nitrides are key to a wide range of applications, including solid-state lighting, optoelectronic devices (such as LEDs and laser diodes), high-power and high-frequency electronics, solar cells, water purification, and communication technologies.
A central aspect of my work is the application and development of scanning electron microscope (SEM)-based diffraction techniques, specifically electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI), using next-generation detectors. I am also interested in integrating these methods with complementary SEM techniques鈥攕uch as cathodoluminescence (CL) hyperspectral imaging, X-ray microanalysis, and electron beam-induced current (EBIC)鈥攖o correlate structural and optical properties at the nano- and microscale.
Professional Activities
- Invited speaker
- 1/1/2025
- Contributor
- 10/6/2024
- Speaker
- 16/5/2024
- Visiting researcher
- 18/3/2024
- Speaker
- 10/1/2024
- Contributor
- 1/12/2023
Projects
- Trager-Cowan, Carol (Principal Investigator) Bruckbauer, Jochen (Research Co-investigator)
- 01-Jan-2025 - 31-Jan-2026
- Trager-Cowan, Carol (Principal Investigator) Bruckbauer, Jochen (Research Co-investigator)
- 01-Jan-2025 - 31-Jan-2026
- Martin, Robert (Principal Investigator) Bruckbauer, Jochen (Research Co-investigator)
- 01-Jan-2024 - 31-Jan-2026
- Bruckbauer, Jochen (CoPI) Martin, Robert (CoPI)
- Joint funding between 糖心视频 and TU Brauschnweig
- 01-Jan-2023 - 31-Jan-2024
- Bruckbauer, Jochen (Co-investigator) Trager-Cowan, Carol (Principal Investigator)
- Co-I/Impact Champion on Impact Acceleration Award (拢15,000) with Quantum Detectors Ltd.
- 01-Jan-2022 - 31-Jan-2023
- Bruckbauer, Jochen (Principal Investigator)
- 01-Jan-2021 - 31-Jan-2023
Contact
Dr
Jochen
Bruckbauer
Research Fellow
Physics
Email: jochen.bruckbauer@strath.ac.uk
Tel: 548 3480